Generating Circuit Tests by Exploiting Designed Behavior

Title: en_US Generating Circuit Tests by Exploiting Designed Behavior
Creator: en_US Shirley, Mark Harper
Date: 2004-10-20T20:00:33Z
Date Available: 2004-10-20T20:00:33Z
Date Issued: en_US 1988-12-01
Identifier: en_US AITR-1099
uri: http://hdl.handle.net/1721.1/6830
Abstract: en_US This thesis describes two programs for generating tests for digital circuits that exploit several kinds of expert knowledge not used by previous approaches. First, many test generation problems can be solved efficiently using operation relations, a novel representation of circuit behavior that connects internal component operations with directly executable circuit operations. Operation relations can be computed efficiently by searching traces of simulated circuit behavior. Second, experts write test programs rather than test vectors because programs are more readable and compact. Test programs can be constructed automatically by merging program fragments using expert-supplied goal-refinement rules and domain-independent planning techniques.
Extent: en_US 307 p.; 44859932 bytes; 36329731 bytes
Format: application/postscript; application/pdf
Language: en_US
Relation: en_US AITR-1099
Subject: en_US knowledge-based systems; en_US VLSI; en_US circuit testing; en_US testsgeneration